Constant and/or highly repetitive movement of cables can compromise the measurement precision of high-performance VNAs. In fact, a recent study showed that globally more than 75% of microwave/RF cable assemblies are replaced frequently due to damage during installation or operation.
Guaranteed Stability for Precise, Repeatable Measurements
GORE® VNA Microwave/RF Test Assemblies set the industry standard through 70 GHz.
GORE VNA Microwave/RF Test Assemblies are specifically engineered to provide the most precise VNA measurements in laboratory conditions. They deliver the highest accuracy and greatest time interval between recalibrations of any test assembly on the market today.
Gore’s assemblies maintain excellent insertion loss and VSWR. Before shipment, we test all of our assemblies for return loss, insertion loss, phase stability and loss stability up to their maximum operating frequency. Our test methods simulate real-world environments to ensure the assembly delivers precise, repeatable measurements in your application.
Our assemblies ensure accurate and repeatable measurements because of their phase and amplitude stability guaranteed with flexure — tested for over 100,000 flex cycles before we retest phase and amplitude stability.
Choose GORE VNA Microwave/RF Assemblies for precise, repeatable measurements for the life of your system.
GORE VNA Microwave/RF Test Assemblies are engineered to perform reliably in a variety of test and measurement applications, including:
- Vector network analyzers
- Testing in lab environments
- Critical measurements
If you have any questions or to discuss your specific application needs, please contact a Gore representative.
Features and Benefits
We have engineered features for GORE VNA Microwave/RF Test Assemblies that make them more durable in demanding environments. Features include:
- NMD-style ruggedized connectors
- Crush resistance greater than 800 lbf/in
- Over 50,000 flexures at minimum bend radius
- Ttorque resistance
- Virtually zero cable spring back
GORE® VNA Microwave/RF Test Assemblies provide manufacturers with many benefits that improve electrical and mechanical performance such as:
- Reliable signal integrity over longer distances with low loss up to 70 GHz
- Reliable, repeatable electrical performance with consistent phase and amplitude stability
- Easy installation with flexible construction and small bend radius
- Decreased weight with smaller diameter for higher density applications
- Design flexibility with a variety of interconnect options
For more information about the features and benefits of our cables, please contact a Gore representative.
Durable and rugged construction
Go to our YouTube Channel to watch these and other videos of Gore engineers demonstrating the benefits of GORE® Microwave/RF Assemblies.
W. L. Gore & Associates announced that its GORE® PHASEFLEX® Microwave/RF Test Assemblies were recognized among the 2020 Military & Aerospace Electronics Innovators Awards. An esteemed and experienced panel of judges from the aerospace and defense community recognized Gore as a Gold honoree. These assemblies are being recognized for their durability and reliability for precision testing of electronic warfare (EW) / radar suites; electronic surveillance/counter measures; radar warning systems; missile approach warning systems; and navigation/communication systems.
Due to the ongoing challenge of COVID-19, IMS2020 has been moved to virtual with live streaming. A key topic at the symposium is 5G connectivity, and Gore will present a portfolio of reliable microwave/RF test assemblies for 5G testing. We’ll describe how our cable assemblies provide durable, stable, and consistent performance to ensuring accurate and reliable testing results.
W. L. Gore & Associates has launched its updated GORE® Microwave/RF Assembly Builder, a step-by-step tool that allows the user to configure and request a quote for an assembly with a variety of connector & cable options, assembly lengths, and frequencies.
Visit us in Booth 1225 to see our full line of GORE® Microwave/RF Assemblies that have been proven in many test and measurement applications.