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SMA, 3.5 mm and 2.92 mm connectors make reliable, RF components and instrumentation possible. These seemingly mundane devices are the result of evolutionary and revolutionary design, covering a 40-year period and involving several corporations. In their present state, they represent highly evolved, well-defined interface systems.

From MPDigest.com, August 2014.

By Robert John, Product Manager, W. L. Gore & Associates

This article, prepared by Gore Associates Robert John and Jerome Lokken, appeared in the Winter 2015 edition of Antenna Systems & Technology Magazine

Reprint from MICROWAVE JOURNAL®

Measurement uncertainty has a direct impact on the reliability of test instruments. To determine if there is a quantifiable difference in measurement uncertainty between the TDR and VNA, W. L. Gore & Associates performed a series of experiments, initially testing six cable assemblies in controlled conditions on each instrument.

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