Test & Measurement
White Papers, 2.69 MB
Measurement uncertainty has a direct impact on the reliability of test instruments. To determine if there is a quantifiable difference in measurement uncertainty between the TDR and VNA, W. L. Gore & Associates performed a series of experiments, initially testing six cable assemblies in controlled conditions on each instrument.
White Papers, 486.92 KB
The environments in which microwave cable assemblies are being used today are becoming more challenging with exposure to such conditions as extreme temperatures, chemicals, abrasion, and flexing. Additional challenges include the need for smaller, lighter packaging for cable systems that last longer and cost less.
White Papers, 1.16 MB
Examines the constraints that may have an impact on cable performance, and the process involved in selecting the right materials based on sufficient testing to verify cables will survive in harsh environments.
White Papers, 1.26 MB
Resulting from a lack of strict adherence to IEEE287 General Precision/Laboratory Precision Connector specifi cations (GPC / LPC), the OSP connector type is not generally considered to be suitable for calibration kit use.
White Papers, 1.35 MB
This technical note addresses phase stability, loss stability, and shielding effectiveness in cable assemblies exceeding 20 feet.
White Papers, 5.48 MB
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