Test & Measurement
White Papers, 2.69 MB
Measurement uncertainty has a direct impact on the reliability of test instruments. To determine if there is a quantifiable difference in measurement uncertainty between the TDR and VNA, W. L. Gore & Associates performed a series of experiments, initially testing six cable assemblies in controlled conditions on each instrument.
White Papers, 486.92 KB
The environments in which microwave cable assemblies are being used today are becoming more challenging with exposure to such conditions as extreme temperatures, chemicals, abrasion, and flexing. Additional challenges include the need for smaller, lighter packaging for cable systems that last longer and cost less.
White Papers, 1.16 MB
Examines the constraints that may have an impact on cable performance, and the process involved in selecting the right materials based on sufficient testing to verify cables will survive in harsh environments.
White Papers, 1.26 MB
Resulting from a lack of strict adherence to IEEE287 General Precision/Laboratory Precision Connector specifi cations (GPC / LPC), the OSP connector type is not generally considered to be suitable for calibration kit use.
White Papers, 1.35 MB
This technical note addresses phase stability, loss stability, and shielding effectiveness in cable assemblies exceeding 20 feet.
White Papers, 5.48 MB
A recent study showed that users of microwave/RF cable assemblies expect high-quality, long-lasting performance; however, more than 75 percent of these users are replacing their assemblies frequently, with the most common cause of failure identified as damage during installation or operation. Depending on the frequency, the direct cost for replacing cable assemblies on a single piece of equipment can reach $250,000 over the life of the system — and this does not include the indirect costs such as delayed production schedules, bad products, or retesting and calibration.
Cables & Cable Assemblies
Selecting a reliable, high-performing microwave/RF cable assembly will eliminate many of the common problems experienced with test systems. Learn more from the white paper.
To download the white paper from Gore, please tell us more about yourself.
Scan the QR Code to share with friends